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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 3391 - 3405 of 4461 items found.

  • Long-Stroke Tensile Testing System For Vulcanized Rubber

    Shimadzu Corp.

    Capable of Measuring Even Specimens with a Large Break Strain A tensile test method for vulcanized rubber is stipulated in JIS K6251 (Rubber,vulcanized or thermoplastic-Determination of tensile stress-strain properties). One of the properties of vulcanized rubber is significant elongation. This long-stroke tensile testing system for vulcanized rubber has a long stroke that is required for calculating these tensile characteristics of rubber, and accommodates dumbbell specimens Nos.1 through 6 stipulated in JIS K6251.

  • Measuring System

    K-5201MA - ViTec Co. Ltd

    To solve this problem, the following composition of the complex was chosen in the test stand conditions:laptop in a protected version PanasonicTBCF-53;measuring block - NIUSB-4431 with a set of vibroaccelerometers AP-2037;vibration excitation system LW 139.151-30 with mounting kit for the disk.The software of the complex provides the following functions:spectral analysis of vibration signals in the regulated range;search for natural excitation frequencies in given frequency ranges;Formation of database of existing disks;generation of reporting forms;and etc.

  • Xenotest Xenon-Arc Instruments

    Atlas Material Testing Technology

    These premium rotating rack, xenon-arc air-cooled weathering instruments have an array of optional features to meet virtually all global weathering and lightfastness test methods. They incorporate state-of-the-art controls, including on-the-rack, radio controlled sensor technology for superior monitoring of light and temperature. They provide highly efficient systems for water and power to provide economical operation. The intuitive user interface makes programming and operation easy.

  • Linear Power Supplies Precision, GPIB or Local Control, Ultra Low Ripple/Noise

    Series ATE-DMG - Kepco, Inc.

    Kepco's 1000 watt instrument-grade digital power supplies, Series ATE-DMG, are linear low-noise power supplies designed to respond very quickly and precisely to voltage and current setting instructions delivered interactively by the GPIB (IEEE 488.2) or from a front panel keypad. When programmed from the bus, the ATE-DMG power supplies respond to the SCPI (Standard Commands for Programmable Instruments) common language for instruments used in an automatic test system.

  • 37 Pin Breakout Interface

    VSI-Breakout-37 - Viewpoint Systems, Inc

    The VSI-Breakout-37 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 100 Pin Breakout Interface

    VSI-Breakout-100 - Viewpoint Systems, Inc

    The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 50 Pin Breakout Interface

    VSI-Breakout-50 - Viewpoint Systems, Inc

    The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 25 Pin Breakout Interface

    VSI-Breakout-25 - Viewpoint Systems, Inc

    The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 68 Pin Breakout Interface

    VSI-Breakout-68 - Viewpoint Systems, Inc

    The VSI-Breakout-68 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 9 Pin Breakout Interface

    VSI-Breakout-9 - Viewpoint Systems, Inc

    The VSI-Breakout-9 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 15 Pin Breakout Interface

    VSI-Breakout-15 - Viewpoint Systems, Inc

    The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • cRIO-PN-S, Slave, C Series PROFINET Slave Interface Module

    782131-01 - NI

    Slave, C Series PROFINET Slave Interface Module - The cRIO-PN-S connects NI programmable automation controllers (PACs) to PROFINET industrial networks as powerful slaves. The interface includes the NI‑PROFINET for CompactRIO driver for human machine interface (HMI) and supervisory control and data acquisition (SCADA) applications. You can perform PROFINET device automated test using these interfaces. The cRIO-PN-S is only compatible with CompactRIO systems.

  • ABex Matrix Module with 86x4 or 43x8 Cross Points

    ABex TM-404 Matrix - Konrad Technologies GmbH

    The ABex TM-404 is a 86×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex TM-404 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus. The back connector allows to connect the TM-404 to the front of a Konrad PXI-501 ICT card to build a very compact ICT instrument. In addition, this combination can be used as an ABex system controller

  • RFIC ATE System

    RI 7100A - Roos Instruments, Inc.

    The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.

  • Sand & Dust Testing

    Environment Associates Inc.

    Products with moving parts, electromechanical components, filtering systems and electronics are all susceptible to fine and large particle dust that can contaminate a product. These contaminates can cause premature failures and loss of function.Today’s test plans for phones, computers, vehicles, enclosures and aircraft include sand and dust testing to determine if this stress source would cause functional deterioration.Our services include military and automotive dust testing for both blowing and agitated dust and sand.

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